HITACHI S-3400N Scanning Electron Microscope

Operating in variable-vacuum conditions and equipped with an EDS x-ray microanalyser, this apparatus provides for the observation and both quantitative and qualitative analysis of metal preparations and non-metal ones that conduct electricity, as well as biological samples, and non-conducting materials

Main parameters of the microscope:

• The microscope can operate:
  • normally (in a high vacuum), with resolution up to 3nm (SE detector) or 4nm(BSE detector),
  • at low voltage (for UACC<5kV, UACC<3kV) – resolution to 10 nm (SE detector),
  • naturally (in a low vacuum) – resolution to 4 nm (BSE detector),
• acceleration voltage 0.3kV 30kV,
• table (automatically on five axes),
• a work chamber of internal diameter 215 mm allows relatively large objects to be observed,
• magnification 5 – 300,000x,
• image memory up to 5120x3840 pixels

The microscope is also equipped with:

• a Pelier-system cooling table,
• an infra-red CCD cell observation camera.

  Additional equipment:

• an E3100 critical point drier apparatus to dry biological preparations in a CO2 atmosphere
• an SC7640-type ion duster to dust samples of metals.